Technology
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Metrology
| Because the RAP process can be used for gross shaping and aspherization of optical substrates, we have developed a set of proprietary non-contact metrology tools for capturing the 3D shape of flat and aspheric optical surfaces that would not be measurable with optical interferometry. Our high-speed, high-data density system measures as many as 100,000 points on the surface in a few minutes. In contrast, traditional coordinate measurement tools can’t measure more than a few points a minute.
In one demonstration, we measured a 1/10 wave PV sphere to an accuracy of +/- 60 nm. In a measurement of a freeform optic, our tool matched interferometric measurements of the same surface to within 2%. |
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RAPT Industries also has a range of conventional optical and surface metrology tools including contact profilometers, 4” and 12” interferometers, a Zygo NewView 5000 interference microscope and a Digital Instruments Nanoscope 300 Atomic Force Microscope.
For more information about RAPT’s contract metrology services and capabilities, contact us at sales@raptindustries.com |
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